SINGLE-SHOT AUTOFOCUSING OF MICROSCOPY IMAGES USING DEEP LEARNING

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United States of America Patent

APP PUB NO 20230085827A1
SERIAL NO

17908864

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ATTORNEY / AGENT: (SPONSORED)

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Abstract

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A deep learning-based offline autofocusing method and system is disclosed herein, termed a Deep-R trained neural network, that is trained to rapidly and blindly autofocus a single-shot microscopy image of a sample or specimen that is acquired at an arbitrary out-of-focus plane. The efficacy of Deep-R is illustrated using various tissue sections that were imaged using fluorescence and brightfield microscopy modalities and demonstrate single snapshot autofocusing under different scenarios, such as a uniform axial defocus as well as a sample tilt within the field-of-view. Deep-R is significantly faster when compared with standard online algorithmic autofocusing methods. This deep learning-based blind autofocusing framework opens up new opportunities for rapid microscopic imaging of large sample areas, also reducing the photon dose on the sample.

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Patent Owner(s)

Patent OwnerAddress
THE REGENTS OF THE UNIVERSITY OF CALIFORNIA1111 FRANKLIN STREET 12TH FLOOR OAKLAND CA 94607

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Huang, Luzhe Los Angeles, US 5 7
Luo, Yilin Los Angeles, US 2 9
Ozcan, Aydogan Los Angeles, US 103 2065
Rivenson, Yair Los Angeles, US 29 211

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