SIMULATION TEST SYSTEM AND SIMULATION TEST METHOD

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United States of America Patent

APP PUB NO 20230056613A1
SERIAL NO

17887527

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Abstract

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A simulation test system and a simulation test method are provided. The simulation test system includes a control device, a power setting device, and a data capture device. The control device generates a context control signal corresponding to one of a plurality of operating contexts. The power setting device generates at least one of a simulated charging power and a simulated load in response to the context control signal and provides at least one of the simulated charging power and the simulated load to a device under test to configure the device under test to generate test data in response to at least one of the simulated charging power and the simulated load. The data capture device captures the test data and provides the test data to the control device.

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Patent Owner(s)

Patent OwnerAddress
COMPAL ELECTRONICS INCTAIPEI

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Chiou, Hao-Jung Taipei City, TW 2 0
Kao, Wen-Hua Taipei City, TW 1 0
Lin, Yi-Hsun Taipei City, TW 25 53
Liu, Chien-Lee Taipei City, TW 4 2
Mi, Tzu-Chiang Taipei City, TW 8 11
Shih, Wei-Chih Taipei City, TW 11 35
Wang, Hsun-Hung Taipei City, TW 2 0

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