Tool Wear Monitoring Device, Tool Wear Monitoring System, and Program

Number of patents in Portfolio can not be more than 2000

United States of America Patent

APP PUB NO 20230008435A1
SERIAL NO

17840900

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Abstract

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Provided is a tool wear monitoring device configured to input a plurality of pieces of image data captured with a microscope camera while changing an angle, and to monitor tool wear. The tool wear monitoring device includes a data analysis unit configured to analyze image data. The data analysis unit binarizes the plurality of pieces of image data captured while changing an angle, extracts data in which a worn region has a maximum area among the plurality of pieces of image data, and analyzes the amount of wear from the extracted data with the maximum area.

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Patent Owner(s)

Patent OwnerAddress
HITACHI LTDTOKYO JAPAN TOKYO METROPOLIS

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
KONO, Ippei Tokyo, JP 8 8
NISHIKAWA, Kenji Tokyo, JP 60 508
SANO, Yasushi Tokyo, JP 44 178

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