Scanning probe system
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United States of America Patent
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Apr 16, 2024
Grant Date -
Dec 8, 2022
app pub date -
Nov 30, 2020
filing date -
Nov 30, 2020
priority date (Note) -
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Abstract
A method of scanning a sample with a scanning probe system, the scanning probe system comprising a probe comprising a cantilever extending from a base to a free end, and a probe tip carried by the free end of the cantilever, the method comprising using the probe to measure an electrostatic interaction between the sample and the probe; and after measuring the electrostatic interaction between the sample and the probe, scanning the sample with the probe while simultaneously applying a bias voltage to the scanning probe system, the applied bias voltage based on the measured electrostatic interaction between the sample and the probe.
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