CELL FOR MEASURING CONCENTRATION OF ADDITIVE BREAKDOWN PRODUCTION IN PLATING SOLUTION

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United States of America Patent

APP PUB NO 20220389606A1
SERIAL NO

17765101

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ATTORNEY / AGENT: (SPONSORED)

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Abstract

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Provided are a measurement method, an electrochemical measuring cell, and a measuring device which are capable of directly and continuously measuring the concentration of monovalent copper ions (Cu+), 3-mercaptopropyl sulfonate (MPS), or Cu+-MPS, which is a plating additive breakdown product, in a plating solution during a copper plating process.

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Patent Owner(s)

Patent OwnerAddress
KOREA INSTITUTE OF MATERIALS SCIENCE797 CHANGWON-DAERO SEONGSAN-GU GYEONGSANGNAM-DO CHANGWON-SI 51508

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
CHOE, Seung-hoe Changwon-si, KR 1 0
HAN, Myeongjin Gyeongsan-si, KR 1 0
KIM, Man Changwon-si, KR 7 15
KWAN, Younghwon Gyeongju-si, KR 1 0
LEE, Joo-yul Gimhae-si, KR 49 109
LEE, Kyun-hwan Changwon-si, KR 1 0
YOO, Bung-uk Changwon-si, KR 1 0

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