METHODS AND SYSTEMS FOR TOPOGRAPHY-SELECTIVE DEPOSITIONS

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United States of America Patent

APP PUB NO 20220375744A1
SERIAL NO

17747197

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Abstract

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Methods and related systems for topographically depositing a material on a substrate are disclosed. The substrate comprises a proximal surface and a gap feature. The gap feature comprises a sidewall and a distal surface. Exemplary methods comprise, in the given order: a step of positioning the substrate on a substrate support in a reaction chamber; a step of subjecting the substrate to a plasma pre-treatment; and, a step of selectively depositing a material on at least one of the proximal surface and the distal surface with respect to the sidewall. The step of subjecting the substrate to a plasma pre-treatment comprises exposing the substrate to at least one of fluorine-containing molecules, ions, and radicals.

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Patent Owner(s)

Patent OwnerAddress
ASM IP HOLDING B VHOLLAND ALMERE ALMERE FLEVOLAND

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Hori, Masaru Nissin-shi, JP 89 2760
Kobayashi, Akiko Tokyo, JP 33 5918
Kobayashi, Nobuyoshi Tokyo, JP 66 5039
Tsutsumi, Takayoshi Nagoya-shi, JP 23 1323
Vervuurt, René Henricus Jozef Leuven, BE 31 235

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