DIE INSPECTION METHOD AND APPARATUS
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United States of America Patent
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Issued Date -
Nov 10, 2022
app pub date -
May 5, 2022
filing date -
May 5, 2021
priority date (Note) -
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status (Latency Note)
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Abstract
A die inspection station for generating an inspection report. The station includes a work surface to receive an entire cutting die thereon for inspection; a housing supporting the work surface; an image capture system supported by the housing above the work surface with an optical axis of the image capture system generally perpendicular to the work surface, the image capture system arranged to capture at least one image of the entire cutting edge of the cutting die; and an illumination source supported by the housing and arranged to illuminate the entire cutting edge at an oblique angle while the image capture system captures the at least one image.
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