LEARNING PROCESS DEVICE AND INSPECTION DEVICE
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United States of America Patent
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Oct 27, 2022
app pub date -
Sep 16, 2020
filing date -
Sep 16, 2020
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Abstract
A learning processing device that is based on a neural network model and image data obtained by capturing an image of the object to be inspected, and constructs the neural network model used for inspecting the object to be inspected. The learning processing device is provided with a learning unit which performs a learning process under a prescribed learning condition on the basis of a list of the image data including a plurality of learning images and constructs the neutral network model. The learning unit embeds unique model identification data in the neural network model, whenever the neural network model is constructed.
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