AFM imaging with metrology-preserving real time denoising

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United States of America Patent

PATENT NO 11796565
APP PUB NO 20220326277A1
SERIAL NO

17226970

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Abstract

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A method of operating an atomic force microscope (AFM), using a denoising algorithm, real-time, during AFM data acquisition. Total Variation and Non-Local Means denoising are preferred. Real time images with minimized sensor noise needing no post-image acquisition processing to account for noise as described herein results.

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Patent Owner(s)

Patent OwnerAddress
BRUKER NANO INC112 ROBIN HILL ROAD SANTA BARBARA CA 93117

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Fonoberov, Vladimir Lompoc, US 7 8
Hand, Sean Santa Barbara, US 5 5
Osborne, Jason Lompoc, US 9 30
Young, James Santa Barbara, US 131 2556

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