APPARATUS FOR PHOTORESIST DRY DEPOSITION

Number of patents in Portfolio can not be more than 2000

United States of America

SERIAL NO

17596928

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Abstract

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Systems and techniques for dry deposition of extreme ultra-violet-sensitive (EUV-sensitive) photoresist layers are discussed. In some such systems, a processing chamber may be provided that features a multi-plenum showerhead that is configured to receive a vaporized organometallic precursor in one plenum and a vaporized counter-reactant thereof in another plenum. The two vaporized reactants may be delivered to a reaction space within the processing chamber and over a wafer support that supports the substrate.

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Patent Owner(s)

Patent OwnerAddress
LAM RESEARCH CORPORATION4650 CUSHING PARKWAY FREMONT CA 94538

International Classification(s)

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Berney, Butch Pleasanton, US 15 1553
Gu, Kevin Li Mountain View, US 11 71
Nardi, Katie Lynn San Jose, US 10 315
Nicholson, Thad San Jose, US 2 10
Schoepp, Alan M Ben Lomond, CA 95005, US 40 1631
Thomas, Clint Edward Newark, US 4 17
Volosskiy, Boris San Jose, US 23 232
Weidman, Timothy William Sunnyvale, US 33 427
Wu, Chenghao Berkeley, US 24 377

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