Probe for scanning probe microscope and binary state scanning probe microscope including the same

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United States of America Patent

PATENT NO 11860188
APP PUB NO 20220308086A1
SERIAL NO

17703791

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Abstract

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Provided is a scanning probe microscope, and in particular, a scanning probe microscope capable of scanning a large area using a probe including a plurality of conductive tips and capable of simply generating a surface image of a sample with high resolution by recognizing only two binary states of contact/non-contact between the conductive tips and a surface of the sample.

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Patent Owner(s)

Patent OwnerAddress
INDUSTRY-ACADEMIC COOPERATION FOUNDATION YONSEI UNIVERSITYSEOUL CITY KOREA SEOUL

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Kim, Gwangmook Seoul, KR 2 1
Shim, Wooyoung Seoul, KR 8 66

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