Nanoscale Dynamic Mechanical Analysis via Atomic Force Microscopy (AFM-nDMA)
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United States of America Patent
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Aug 11, 2022
app pub date -
Apr 18, 2022
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Aug 6, 2018
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Abstract
An atomic-force-microscope-based apparatus and method including hardware and software, configured to collect, in a dynamic fashion, and analyze data representing mechanical properties of soft materials on a nanoscale, to map viscoelastic properties of a soft-material sample. The use of the apparatus as an addition to the existing atomic-force microscope device.
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