Nanoscale Dynamic Mechanical Analysis via Atomic Force Microscopy (AFM-nDMA)

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United States of America Patent

APP PUB NO 20220252638A1
SERIAL NO

17722603

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Abstract

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An atomic-force-microscope-based apparatus and method including hardware and software, configured to collect, in a dynamic fashion, and analyze data representing mechanical properties of soft materials on a nanoscale, to map viscoelastic properties of a soft-material sample. The use of the apparatus as an addition to the existing atomic-force microscope device.

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Patent OwnerAddress
BRUKER NANO INC112 ROBIN HILL ROAD GOLETA CA 93117

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  • 2022 Application Filing Year
  • G01Q Class
  • 73 Applications Filed
  • 28 Patents Issued To-Date
  • 38.36 % Issued To-Date
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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Osechinskiy, Sergey Goleta, US 10 16
Pittenger, Bede Goleta, US 12 33
Ruiter, Anthonius Goleta, US 7 12
Syed-Amanulla, Syed-Asif Minneapolis, US 5 8

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