INSPECTION METHOD AND SYSTEM
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United States of America Patent
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Issued Date -
Aug 4, 2022
app pub date -
Feb 14, 2022
filing date -
Mar 28, 2011
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Abstract
An inspection method includes the following steps: identifying a plurality of patterns within an image; and comparing the plurality of patterns with each other for measurement values thereof. The above-mentioned inspection method uses the pattern within the image as a basis for comparison; therefore, measurement values of the plurality of pixels constructing the pattern can be processed with statistical methods and then compared, and the false rate caused by variation of a few pixels is decreased significantly. An inspection system implementing the above-mentioned method is also disclosed.
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