DOPED TITANIUM NITRIDE MATERIALS FOR DRAM CAPACITORS, AND RELATED SEMICONDUCTOR DEVICES

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United States of America

APP PUB NO 20220208767A1
SERIAL NO

17655257

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Abstract

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A DRAM capacitor comprising a first capacitor electrode configured as a container and comprising a doped titanium nitride material, a capacitor dielectric on the first capacitor electrode, and a second capacitor electrode on the capacitor dielectric. Methods of forming the DRAM capacitor are also disclosed, as are semiconductor devices and systems comprising such DRAM capacitors.

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Patent Owner(s)

Patent OwnerAddress
MICRON TECHNOLOGY INCBOISE ID 83707-0006

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Antonov, Vassil Boise, US 25 119
Kelkar, Sanket S Boise, US 11 18
Paduano, Paul A Nampa, US 8 39
Petz, Christopher W Boise, US 40 152
Rocklein, Matthew N Boise, US 41 240
Song, Zhe Boise, US 19 115
Tao, Qian Boise, US 107 1015

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