Abnormality Detection Circuit And Abnormality Detection Method

Number of patents in Portfolio can not be more than 2000

United States of America

APP PUB NO 20220208492A1
SERIAL NO

17560766

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Abstract

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An abnormality detection circuit includes an AC power source coupled to a load via first and second wiring lines, a first relay contact disposed in the middle of the first wiring line, a second relay contact disposed in the middle of the second wiring line, a comparative voltage detection circuit to which a voltage is applied from the AC power source irrespective of whether the first and second relay contacts are open or closed, a first voltage detection circuit to which a voltage is applied from the AC power source when the first relay contact is closed, a second voltage detection circuit to which a voltage is applied from the AC power source when the second relay contact is closed, and an abnormality detector that detects abnormalities of the first relay contact by comparing the voltage applied to the comparative voltage detection circuit with the voltage applied to the first voltage detection circuit and detects abnormalities of the second relay contact by comparing the voltage applied to the comparative voltage detection circuit with the voltage applied to the second voltage detection circuit.

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Patent Owner(s)

Patent OwnerAddress
SEIKO EPSON CORPORATION1-6 SHINJUKU 4-CHOME SHINJUKU-KU TOKYO 1608801 ?1608801

International Classification(s)

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  • 2021 Application Filing Year
  • H01H Class
  • 1046 Applications Filed
  • 655 Patents Issued To-Date
  • 62.62 % Issued To-Date
Click to zoom InYear of Issuance% of Matters IssuedCumulative IssuancesYearly Issuances202120222023202420250255075100

Inventor(s)

Inventor Name Address # of filed Patents Total Citations
KATAYAMA, Toshihiko Yamagata, JP 27 142

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Citation count rangeNumber of patents cited in rangeNumber of patents cited in various citation count ranges1303520201 - 1011 - 20010020030040050060070080090010001100120013001400

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