SWITCHING MATRIX SYSTEM AND OPERATING METHOD THEREOF FOR SEMICONDUCTOR CHARACTERISTIC MEASUREMENT
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United States of America
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Issued Date -
Jun 30, 2022
app pub date -
Dec 30, 2020
filing date -
Dec 30, 2020
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Abstract
The present disclosure provides a switching matrix system and an operating method thereof for semiconductor characteristic measurement. The switching matrix system is configured to: detect an assembly of at least one switching matrix module inserted into a plurality of slots of the switching matrix system; determine a user interface according to the assembly of the at least one switching matrix module inserted into the slots, wherein the user interface includes an operable object corresponding to the assembly; and provide the user interface.
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