AUTOMATIC FREQUENCY CALIBRATION AND LOCK DETECTION CIRCUIT AND PHASE LOCKED LOOP INCLUDING THE SAME

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United States of America Patent

APP PUB NO 20220190834A1
SERIAL NO

17536514

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ATTORNEY / AGENT: (SPONSORED)

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Abstract

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An automatic frequency calibration and lock detection circuit includes a frequency error generator circuit, an automatic frequency calibration signal generator circuit, and a lock flag generator circuit. The frequency error generator circuit generates a frequency error signal based on a reference frequency signal and an output frequency signal. The frequency error signal represents a difference between a frequency of the output frequency signal and a target frequency. The automatic frequency calibration signal generator circuit generates an automatic frequency calibration output signal and an automatic frequency calibration done signal based on the frequency error signal and a first clock signal. The lock flag generator circuit generates a lock done signal based on the frequency error signal, the automatic frequency calibration done signal and a second clock signal. The frequency error generator circuit is shared by the automatic frequency calibration signal generator circuit and the lock flag generator circuit.

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Patent Owner(s)

Patent OwnerAddress
SAMSUNG ELECTRONICS CO LTDGYEONGGI DO SOUTH KOREA GYEONGGI-DO

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
KIM, Seungjin Yongin-si, KR 59 127
LIM, Baekmin Daejeon, KR 4 2

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