SURFACE SHAPE DETECTION DEVICE AND DETECTION METHOD

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United States of America Patent

APP PUB NO 20220178846A1
SERIAL NO

17599352

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ATTORNEY / AGENT: (SPONSORED)

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Abstract

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A surface shape detection device using differential interference optics achieves restoration error reduction of a surface shape while maintaining resolution. The surface shape detection device includes: a light spot scanning unit such as a wafer rotation direction drive unit that scans a wafer surface with a light spot; an interference light detection mechanism such as a differential interference optical system that detects interference light of light obtained by scanning a surface of an inspection target with a plurality of the light spots separated by a predetermined design distance; and a surface shape restoration processing unit such as a wafer surface shape restoration unit that samples, at a predetermined quantization time interval, and calculates information of the interference light, and performs restoration processing on a surface shape of the wafer, in which the predetermined design distance is larger than a quantization distance interval corresponding to the predetermined quantization time interval.

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Patent Owner(s)

Patent OwnerAddress
HITACHI HIGH-TECH CORPORATIONTOKYO

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
HOSAKA, Makoto Tokyo, JP 22 46
ONOE, Shinsuke Tokyo, JP 22 41
YAMADA, Kenichiro Tokyo, JP 139 3463

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