SINGLE-SHOT HYPERSPECTRAL WAVEFRONT SENSOR

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United States of America Patent

APP PUB NO 20220178760A1
SERIAL NO

17442976

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ATTORNEY / AGENT: (SPONSORED)

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A method for determining wavefront shapes of a multi-spectral signal light beam from a single signal image acquisition of said multi-spectral signal beam, with a device including an optical assembly made at least of an optical mask and an imaging sensor, notably a matrix imaging sensor, for generating and recording intensity patterns of incident beams, by having these beams reflect on, or propagate through, the optical mask. The optical mask having the optical properties: i) to cause the intensity pattern to depend on the wavefront shape, so that a tilt applied to the wavefront shape results in a displacement amount of the intensity pattern, and ii) to produce uncorrelated intensity patterns over at least one surface area A of the imaging sensor, for a plurality of respective incident monochrome beams of different wavelengths having a same wavefront shape.

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Patent Owner(s)

Patent OwnerAddress
CENTRE NATIONAL DE LA RECHERCHE SCIENTIFIQUE3 RUE MICHEL ANGE PARIS 75016
ECOLE POLYTECHNIQUEROUTE DE SACLAY PALAISEAU CEDEX 91128
COMMISSARIAT A L'ENERGIE ATOMIQUE ET AUX ENERGIES ALTERNATIVESPARIS FRANCE PARIS PARIS
SORBONNE UNIVERSITE21 RUE DE L’ÉCOLE DE MÉDECINE PARIS 75006
UNIVERSITE DE PARIS85 BOULEVARD SAINT GERMAIN PARIS 75006

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
BERTO, Pascal Paris, FR 4 11
GUILLON, Marc Versailles, FR 5 10
PAPADOPOULOS, Dimitris Antony, FR 5 19
TESSIER, Gilles PARIS, FR 5 18

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