METHOD AND SYSTEM FOR APPLYING A PATTERN ON A MASK LAYER
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United States of America Patent
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Issued Date -
Jun 9, 2022
app pub date -
Mar 19, 2020
filing date -
Mar 19, 2020
priority date (Note) -
Published
status (Latency Note)
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Abstract
A method for applying a pattern on a mask layer includes obtaining an image file representing pixels with a first pixel size in a first direction parallel to an edge of the pixel, and a second pixel size in a second direction perpendicular to the first direction, where the first and second pixel size are the same or different, treating the mask layer such that a plurality of areas with altered physical properties are created in the mask layer, the plurality of areas corresponding to a plurality of pixels of the image file, where the treatment is done such that a first and/or a second area size of an area of said plurality of areas, seen in said first and/or said second direction, is smaller than the first and/or second pixel size, respectively.
First Claim
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Family

- 15 United States
- 10 France
- 8 Japan
- 7 China
- 5 Korea
- 2 Other
Patent Owner(s)
Patent Owner | Address | |
---|---|---|
XSYS PREPRESS N V | 8900 IEPER |
International Classification(s)

- 2020 Application Filing Year
- B41C Class
- 43 Applications Filed
- 16 Patents Issued To-Date
- 37.21 % Issued To-Date
Inventor(s)
Inventor Name | Address | # of filed Patents | Total Citations |
---|---|---|---|
DE, RAUW Dirk Ludo Julien | Ninove, BE | 11 | 0 |
# of filed Patents : 11 Total Citations : 0 |
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Patent Citation Ranking
- 0 Citation Count
- B41C Class
- 0 % this patent is cited more than
- 3 Age
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