SPUTTERING TARGET AND METHOD OF MANUFACTURING THE SAME, AND MEMORY DEVICE MANUFACTURING METHOD

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United States of America Patent

APP PUB NO 20220162742A1
SERIAL NO

17602352

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Abstract

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Provided are a sputtering target that makes it possible to form a chalcogenide material film with enhanced heat resistance, a method of manufacturing the sputtering target, and a memory device manufacturing method. The sputtering target includes an alloy containing a first component containing arsenic and selenium and a second component containing at least one of boron and carbon.

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Patent Owner(s)

Patent OwnerAddress
SONY SEMICONDUCTOR SOLUTIONS CORPORATION4-14-1 ASAHI-CHO ATSUGI-SHI KANAGAWA 2430014 ?2430014

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
ARATANI, Katsuhisa Kanagawa, JP 128 1644
OHBA, Kazuhiro Kanagawa, JP 69 905
SEI, Hiroaki Kanagawa, JP 29 169
YASUDA, Shuichiro Kanagawa, JP 50 653

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