DEVICE UNDER TEST SYNCHRONIZATION WITH AUTOMATED TEST EQUIPMENT CHECK CYCLE
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United States of America Patent
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Issued Date -
May 19, 2022
app pub date -
Nov 17, 2021
filing date -
Nov 17, 2021
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Abstract
Systems, integrated circuits and methods for synchronizing testing a Device under test (DUT) with an automated test equipment (ATE) is provided. In one example, a method includes transmitting a test packet from an ATE to a first Device Under Test DUT; receiving, at the ATE from the DUT, a result packet; and in response to receiving a Start of Packet (SOP) indicator from the DUT at the ATE, evaluating the first DUT by comparing the result packet to an expected packet associated with the test packet.
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