X-ray inspection apparatus and deterioration determination method for X-ray inspection apparatus
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United States of America Patent
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Nov 1, 2022
Grant Date -
May 12, 2022
app pub date -
Jul 1, 2021
filing date -
Nov 9, 2020
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Abstract
Provided is an X-ray inspection apparatus including: an X-ray tube configured to generate X-rays; a high-voltage power source configured to supply a tube voltage to the X-ray tube to generate X-rays; an X-ray irradiation control section configured to output a first control signal and a second control signal to the high-voltage power source to control the high-voltage power source; and a determination section configured to count at least one of the first control signal and the second control signal output from the X-ray irradiation control section to the high-voltage power source, compare a counted count value with a preset threshold value, and determine a deterioration state of a component constituting the X-ray tube.
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