SEMICONDUCTOR DEVICE INCLUDING DIFFERENTIAL INPUT CIRCUIT AND CALIBRATION METHOD THEREOF
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United States of America
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May 3, 2022
Grant Date -
May 5, 2022
app pub date -
Mar 2, 2021
filing date -
Mar 2, 2021
priority date (Note) -
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Abstract
According to an embodiment, a semiconductor device includes a differential input circuit suitable for receiving first and second input signals respectively inputted to first and second input transistors, and outputting an output signal; a comparison circuit suitable for generating a first judge signal by comparing the output signal with a first comparison voltage, and generating a second judge signal by comparing the output signal with a second comparison voltage, in a calibration mode; an offset control circuit suitable for adjusting coarse codes and fine codes, according to the first and second judge signals; and an offset adjusting circuit suitable for adjusting a drivability of each of the first and second input transistors by a first strength, according to the coarse codes, and adjusting the drivability of each of the first and second input transistors by a second strength smaller than the first strength, according to the fine codes.
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