HIGH-SPEED FUNCTIONAL PROTOCOL BASED TEST AND DEBUG
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United States of America
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Issued Date -
Apr 21, 2022
app pub date -
Oct 14, 2021
filing date -
Oct 14, 2021
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Abstract
An integrated circuit (IC) device and a method for communicating test data utilizes test control circuitry, and a test controller. The test controller is coupled with the test control circuitry and decodes packetized test pattern data to identify configuration data for the test controller and test data for the test control circuitry. The test controller further communicates the test data to the test control circuitry, and packetizes resulting data received from the test control circuitry. The resulting data corresponds to errors identified by a test performed based on the test pattern data.
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