DESIGN INTERFACES FOR ASSISTED DEFECT RECOGNITION SYSTEMS
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United States of America
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Apr 7, 2022
app pub date -
Sep 29, 2021
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Sep 29, 2021
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Abstract
Described herein are examples of interfaces for designing and/or configuring custom assisted defect recognition (ADR) systems and/or workflows. In some examples, the ADR systems and/or workflows may be designed and/or configured using visual tools, such as, for example, node based processing tools. In some examples, the ADR workflows may be used to analyze two dimensional (2D) and/or three dimensional (3D) image scans, such as might be generated by industrial X-ray scanning systems.
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