ETCHING METHOD AND ETCHING APPARATUS

Number of patents in Portfolio can not be more than 2000

United States of America

APP PUB NO 20220102160A1
SERIAL NO

17547238

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Abstract

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An etching method includes: a physical adsorption process of physically adsorbing an adsorbate based on a first processing gas on a film to be etched under a condition that the pressure of the first processing gas is smaller than the saturated vapor pressure of the first processing gas with respect to a temperature of an object to be processed while cooling the object to be processed on which the film to be etched is formed; and an etching process of etching the film to be etched by reacting the adsorbate with the film to be etched by a plasma of a second processing gas.

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Patent Owner(s)

Patent OwnerAddress
TOKYO ELECTRON LIMITEDTOKYO JAPAN
UNIVERSITE D'ORLEANS45100 ORLÉANS

International Classification(s)

Inventor(s)

Inventor Name Address # of filed Patents Total Citations
ANTOUN, Gaëlle Dardilly, FR 3 0
DUSSART, Remi Saint-Pryve Saint-Mesmin, FR 6 11
FAGUET, Jacques Austin, US 52 4097
LEFAUCHEUX, Philippe Mareau-aux-pres, FR 4 10
MAEKAWA, Kaoru Albany, US 41 533
ONO, Kumiko Tokyo, JP 11 41
SATO, Nagisa Tokyo, JP 9 6
TAHARA, Shigeru Miyagi, JP 57 885
TILLOCHER, Thomas Orleans, FR 5 11

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