Method For Tuning Work Function Using Surface Photo Voltage and Producing Ultra-Low-Work-Function Surfaces, and Devices Operational Therewith
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United States of America
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Mar 24, 2022
app pub date -
Nov 30, 2021
filing date -
Nov 30, 2021
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Abstract
The embodiments provide a thermionic emission device and a method for tuning a work function in a thermionic emission device is provided. The method includes illuminating an N type semiconductor material of a first member of a thermionic emission device, wherein a work function of the N type semiconductor material is lowered by the illuminating. The method includes collecting, on one of the first member or a second member of the thermionic emission device, electrons emitted from one of the first member or the second member.
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