THREE-DIMENSIONAL MEASUREMENT DEVICE AND THREE-DIMENSIONAL MEASUREMENT METHOD

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United States of America

APP PUB NO 20220082374A1
SERIAL NO

17534539

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Abstract

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A three-dimensional measurement device performs three-dimensional measurement of a measured object using a phase shift method. The three-dimensional measurement device includes: an irradiator that irradiates the measured object with a predetermined light pattern having a light intensity distribution in a fringe shape; a control device that shifts a phase of the light pattern radiated from the irradiator in N different ways, where N is a natural number of not less than 3; and an imaging device that takes an image of the measured object irradiated with the light pattern. The control device executes three-dimensional measurement of the measured object by the phase shift method based on N different image data taken under the light pattern having the phase shifted in the N different ways.

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CKD CORPORATIONKOMAKI-SHI AICHI-KEN

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Ohyama, Tsuyoshi Aichi, JP 64 463
Okuda, Manabu Aichi, JP 7 61
Sakaida, Norihiko Aichi, JP 24 54

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