MEASURING SYSTEM, MEASURING METHOD, AND MEASURING PROGRAM

Number of patents in Portfolio can not be more than 2000

United States of America

APP PUB NO 20220018658A1
SERIAL NO

17299362

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ATTORNEY / AGENT: (SPONSORED)

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Abstract

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A measuring system configured to measure a position of an object is provided with an imaging apparatus and an information processing apparatus, wherein: the imaging apparatus is a camera having a frame rate of 100 fps or higher, and is configured to image the object included in the angle of view of the camera, as an image; the information processing apparatus is provided with a communication unit, an IPM conversion unit, and a position measuring unit; the communication unit is connected to the imaging apparatus, and is configured to receive the image captured by the imaging apparatus; the IPM conversion unit is configured to set at least a part of the image including the object as a predetermined area, and to perform an inverse perspective projection transportation of the image to generate an IPM image limited to the predetermined area. Here, the IPM image is an image in which a predetermined area including the object is rendered as seen from overhead; and the position measuring unit is configured to measure the position of the object on the basis of the IPM image.

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Patent Owner(s)

Patent OwnerAddress
THE UNIVERSITY OF TOKYO3-1 HONGO 7-CHOME BUNKYO-KU TOKYO 1138654 ?1138654

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
HIRANO, Masahiro Tokyo, JP 86 20923
ISHIKAWA, Masatoshi Tokyo, JP 104 1706
KISHI, Norimasa Tokyo, JP 72 2991
SENOO, Taku Tokyo, JP 2 0

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