Test and Characterization of Ring in Superconducting Domain Through Built-In Self-Test
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United States of America Patent
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Issued Date -
Nov 18, 2021
app pub date -
May 14, 2020
filing date -
May 14, 2020
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Abstract
Ring packet built-in self-test (PBIST) circuitry configured to detect errors in wires connecting a ring of superconducting chips includes circuitry configured to make the PBIST immune to interchip latency and still allow the PBIST to test a stop-to-stop connection. By making a PBIST independent of latency, an entire ring can be characterized for latency and for its bit-error rate prior to running any functional test. Such systems and associated methods can be scaled to larger platforms having any number of ring stops. The PBIST circuitry can function as either transmitter or receiver, or both, to test an entire ring. The PBIST can also be used to tune clocks in the ring to achieve the lowest overall bit error rate (BER) in the ring.
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