SYSTEM AND METHOD FOR X-RAY ABSORPTION SPECTROSCOPY USING A CRYSTAL ANALYZER AND A PLURALITY OF DETECTOR ELEMENTS

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United States of America Patent

APP PUB NO 20210356412A1
SERIAL NO

17320852

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ATTORNEY / AGENT: (SPONSORED)

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Abstract

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An apparatus includes a crystal analyzer positioned relative to an x-ray source on a Rowland circle in a tangential plane and having a Rowland circle radius (R). The crystal analyzer includes crystal planes curved along at least one direction within at least the tangential plane with a radius of curvature substantially equal to twice the Rowland circle radius (2R). The crystal planes are configured to receive x-rays from the x-ray source and to disperse the received x-rays according to Bragg's law. The apparatus further includes a spatially resolving detector configured to receive at least a portion of the dispersed x-rays. The spatially resolving detector includes a plurality of x-ray detection elements having a tunable first x-ray energy and/or a tunable second x-ray energy. The plurality of x-ray detection elements are configured to measure received dispersed x-rays having x-ray energies below the first x-ray energy while suppressing measurements of the received dispersed x-rays above the first x-ray energy and/or to measure the received dispersed x-rays having x-ray energies above the second x-ray energy while suppressing measurements of the received dispersed x-rays below the second x-ray energy. The first and second x-ray energies are tunable in a range of 1.5 keV to 30 keV.

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Patent Owner(s)

Patent OwnerAddress
SIGRAY INC5750 IMHOFF DRIVE SUITE I CONCORD CA 94520

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Kirz, Janos Berkeley, US 51 1475
Lewis, Sylvia Jia Yun San Francisco, US 45 1447
Qiao, Ruimin Berkeley, US 3 13
Seshadri, Srivatsan Pleasanton, US 18 509
Yun, Wenbing Walnut Creek, US 99 3901

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