ABNORMALITY DETECTION APPARATUS AND ABNORMALITY DETECTION METHOD

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United States of America Patent

APP PUB NO 20210302197A1
SERIAL NO

17188001

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ATTORNEY / AGENT: (SPONSORED)

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Abstract

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An abnormality detection apparatus is a device for detecting an abnormality of an object, and detects the abnormality of the object by performing predetermined processing on second signals in a predetermined region among first signals derived from vibration acquired from the object.

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Patent Owner(s)

Patent OwnerAddress
HITACHI LTDTOKYO TOKYO METROPOLIS

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
KAWAGUCHI, Yohei Tokyo, JP 61 320
SUEFUSA, Kaori Tokyo, JP 1 0

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