ELECTROPOLISHING SYSTEM WITH PROBE FOR INTERNAL DEBURRING OF PART AND METHOD OF USING THE SAME
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United States of America Patent
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Issued Date -
Sep 16, 2021
app pub date -
Mar 11, 2020
filing date -
Mar 11, 2020
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Abstract
A probe assembly of an electropolishing system for electropolishing a surface of a part is disclosed. The probe assembly includes a supply line, at least a part of which is flexible. The supply line defines a fluid passage for a flow of an electrolyte therethrough. The probe assembly also includes an electrode with at least one aperture. The electrode is attached to the supply line and is fluidly connected to the fluid passage for receiving the electrolyte and outputting the electrolyte via the at least one aperture. The electrode is configured to be electrically charged for electropolishing the surface of the part. Also, the probe assembly includes a sensor that is attached to at least one of the supply line and the electrode. The sensor is configured to provide substantially real-time feedback corresponding to the electropolishing of the surface of the part. Methods of using the system are also disclosed.
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