Method and system for line-by-line one dimensional fabric inspection

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United States of America Patent

PATENT NO 12000070
APP PUB NO 20210238781A1
SERIAL NO

17272317

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Abstract

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System and method for on-loom fabric inspection includes an imaging device collecting images of a weaving area of a loom, a frame grabber receiving images of a fell-pick of and sending compact image data packages to an image processor. Irregularities may be detected by comparing a digital string representing the characteristic sequence of warp-risers and warp-sinkers along the fell-pick with a corresponding row (901) of required warp-risers and required warp-sinkers in a reference matrix (900) representing a required weaving pattern. The digital string may be a sequence of Boolean values.

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Patent Owner(s)

Patent OwnerAddress
USTER TECH LTDNot Provided

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Cohen, Shmuel Kadima, IL 23 66

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Citation count rangeNumber of patents cited in rangeNumber of patents cited in various citation count ranges16401727201 - 1011 - 200100020003000400050006000700080009000100001100012000130001400015000160001700018000

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