Sample Holder for Electron Microscopy
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United States of America Patent
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Issued Date -
Jul 8, 2021
app pub date -
Mar 23, 2021
filing date -
Mar 23, 2021
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Abstract
The apparatus is for use with an electron microscope, a sample, a source of high pressure gas and a vacuum pump system. The apparatus includes a holder part a body part and a Joule-Thomson refrigerator. The holder part is adapted to receive the sample and adapted to present the sample to the microscope for inspection in use. The body part defines a cavity, the cavity being evacuated by die vacuum pump system for use. The refrigerator is disposed within the cavity and thermally-coupled to the holder part, the refrigerator being coupled in use to the source of high pressure gas to maintain the sample at about a predetermined temperature.
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