METHOD OF MARKING A SOLID-STATE MATERIAL, MARKINGS FORMED FROM SUCH METHODS AND SOLID-STATE MATERIALS MARKED ACCORDING TO SUCH A METHOD

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United States of America Patent

APP PUB NO 20210146716A1
SERIAL NO

16622606

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Abstract

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A method of forming a non-optically detectable identifiable marking invisible to the naked eye is formed from plural recesses of multiple levels at an outer surface of an article formed from a solid-state material. The method includes forming plural recesses of multiple levels within a predetermined region of a photoresist applied to an outer surface of an article formed from a solid-state material. The plural recesses are formed by grayscale lithography and the recesses extend at least partially through the photoresist and towards the outer surface of the article formed from a solid-state material. The method also includes applying an etching process such that at least a portion of the outer surface of said article is exposed and etched to form plural etched portions extending into the article from its outer surface and corresponding to plural recesses; wherein said predetermined region of said photoresist defines an identifiable marking to be applied to the outer surface of said article; wherein said plurality of etched portions forms the non-optically identifiable marking on the outer surface of said article.

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Patent Owner(s)

Patent OwnerAddress
MASTER DYNAMIC LIMITEDUNIT 108B-109 1/F BIOTECH CENTRE 1 NO 9 SCIENCE PARK WEST AVENUE SHATIN NEW TERRITORIES

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
HUANG, Jianxing Pak Shek Kok, New Territories, HK 18 45
LUI, Siu Lung Pak Shek Kok, New Territories, HK 1 0
WANG, Yingnan Pak Shek Kok, New Territories, HK 14 70

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