Scanning Sensor Having a Spin Defect
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United States of America Patent
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Issued Date -
May 13, 2021
app pub date -
Mar 14, 2018
filing date -
Mar 16, 2017
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Abstract
A sensor device includes a carrier, a force feedback sensor, and a probe containing a spin defect, the probe being connected to the force feedback sensor either directly or indirectly via a handle structure. In order to couple the spin defect to a microwave field in an efficient and robust manner, the sensor device includes an integrated microwave antenna arranged at a distance of less than 500 micrometers from the spin defect. The sensor device can be configured as a self-contained exchangeable cartridge that can easily be mounted in a sensor mount of a scanning probe microscope.
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