APPARATUS FOR MEASURING A STRUCTURE AND ASSOCIATED METHOD
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United States of America Patent
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Mar 11, 2021
app pub date -
Sep 11, 2020
filing date -
Sep 11, 2019
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Abstract
A measuring apparatus for measuring a structure comprises at least one measurement sensor configured to measure the structure, a bearing platform configured to carry the at least one measurement sensor and a control. The control is configured to specify at least one quality reference value for at least one characteristic of measurement quality, and further configured to adjust one or more parameters of the measuring apparatus which influence the at least one characteristic of measurement quality. An actual quality value is determined and approaches the at least one quality reference value as the one or more parameters are adjusted.
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