System and method for internal structural defect analysis using three-dimensional sensor data
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United States of America Patent
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Nov 16, 2021
Grant Date -
Jan 14, 2021
app pub date -
Sep 3, 2020
filing date -
Sep 9, 2015
priority date (Note) -
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status (Latency Note)
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Abstract
A method and system for structural analysis of an object detects deviations between a physical object model and a predetermined three-dimensional model of the object. The physical object model is generated from scanned surface data of an object produced by a three-dimensional sensor. The physical object model is aligned with the predetermined three-dimensional model of the object to identify an interference between a location of the aligned physical object model and the predetermined three-dimensional model of the object that corresponds with any elastic deformation of an internal component within the predetermined three-dimensional model. An indicator of expected damage to the internal component arising from the elastic deformation is generated.
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| Fee | Large entity fee | small entity fee | micro entity fee | due date |
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| 3.5 Year Payment | $1600.00 | $800.00 | $400.00 | May 16, 2025 |
| 7.5 Year Payment | $3600.00 | $1800.00 | $900.00 | May 16, 2029 |
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