ENVIRONMENTAL PARAMETER MEASUREMENT SYSTEMS

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United States of America Patent

APP PUB NO 20200400460A1
SERIAL NO

17013698

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ATTORNEY / AGENT: (SPONSORED)

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Abstract

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The present disclosure discloses a method for determining a corrected measured value of an environmental parameter. The method may include obtaining a relationship between a deviation of a measured value of an environmental parameter of a first sensing device and at least one measurement condition of a heat generating device. The first sensing device may be located near the heat generating device. The method may further include obtaining at least one current value of the at least one measurement condition and a current measured value of the environmental parameter, and determining a current deviation based at least in part on the at least one current value of the at least one measurement condition of the heat generating device and the relationship. The method may further include determining a corrected measured value of the environmental parameter based on the current measured value of the environmental parameter and the current deviation.

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Patent Owner(s)

Patent OwnerAddress
METIS IP (SUZHOU) LLC9 XUESEN STREET BUILDING 2-B 4TH FLOOR GAOXIN DISTRICT SUZHOU

International Classification(s)

Inventor(s)

Inventor Name Address # of filed Patents Total Citations
FAN, Junjun Shanghai, CN 3 0
GUAN, Shan FREMONT, US 39 839
LI, Kan Shanghai, CN 42 196

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