WAFER PROCESSING METHOD

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United States of America Patent

APP PUB NO 20200357612A1
SERIAL NO

16938432

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ATTORNEY / AGENT: (SPONSORED)

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Abstract

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A method of wafer processing includes supporting a wafer in a process chamber. The method further includes introducing a flow of a gaseous material through an inlet of the process chamber to process the wafer. The method further includes generating, between the inlet and the wafer, controllable forces acting in various directions on the gaseous material to spread the gaseous material inside the process chamber.

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Patent Owner(s)

Patent OwnerAddress
TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY LTDHSIN-CHU

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
CHEN, Fei-Fan Hsinchu City, TW 6 13
HUANG, Chien Kuo Hsinchu City, TW 5 13
HUANG, Shih-Wen Tainan City, TW 37 252
LIOU, Joung-Wei Zhudong Town, TW 66 543
SHEN, Chia-I Hsinchu City, TW 9 92

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