Method of performing atomic force microscopy with an ultrasound transducer

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United States of America Patent

PATENT NO 11067597
APP PUB NO 20200348334A1
SERIAL NO

16760687

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Abstract

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A method of performing atomic force microscopy (AFM) measurements, uses an ultrasound transducer to transmit modulated ultrasound waves with a frequency above one GHz from the ultrasound transducer to a top surface of a sample through the sample from the bottom surface of the sample. Effects of ultrasound wave scattering are detected from vibrations of an AFM cantilever at the top surface of the sample. Before the start of the measurements, a drop of a liquid is placed on a top surface of the ultrasound transducer. The sample is placed on the top surface of the ultrasound transducer, whereby the sample presses the liquid in the drop into a layer of the liquid between the top surface of the ultrasound transducer and a bottom surface of the sample. The AFM measurements are started after a thickness of the layer of the liquid has stabilized.

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Patent Owner(s)

Patent OwnerAddress
NEDERLANDSE ORGANISATIE VOOR TOEGEPAST-NATUURWETENSCHAPPELIJK ONDERZOEK TNOANNA VAN BUERENPLEIN 1 'S-GRAVENHAGE 2595 DA

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Sadeghian, Marnani Hamed Nootdorp, NL 60 47
Van, Es Maarten Hubertus Voorschoten, NL 23 21
Van, Neer Paul Louis Maria Joseph Bergschenhoek, NL 38 20
Van, Riel Martinus Cornelius Johannes Maria s-Gravenzande, NL 5 0

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