Method and system for measuring g-sensitivity of quartz oscillators

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United States of America Patent

PATENT NO 10879908
APP PUB NO 20200313676A1
SERIAL NO

16616591

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Abstract

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A method and system are provided for estimating the g-sensitivity of a quartz oscillator, which includes rotating the quartz oscillator successively around each of a plurality of axes constituting a full-rank system, measuring a frequency of the quartz oscillator at a predetermined rate as a function of time during rotation, and estimating an integral g-sensitivity vector while the quartz oscillator is rotated. Estimation can be performed utilizing a data fitting and estimation model, e.g., a Least Square Method (LSM) in one example, using the frequency measurements obtained while the quartz oscillator is in rotation around the axes. The method and system are especially useful for measuring g-sensitivity of quartz oscillators that are incorporated in high-precision systems, such as navigation receivers, which operate in environments that are subjected to vibrational effects and other mechanical forces.

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Patent Owner(s)

Patent OwnerAddress
TOPCON POSITIONING SYSTEMS INC7400 NATIONAL DRIVE LIVERMORE CA 94550

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
Beloglazov, Vladimir Victorovich Moscow, RU 5 10
Kurynin, Roman Valerievich Moscow, RU 3 0
Kuzmitchev, Vadim Borisovish Moscow, RU 1 0
Milyutin, Danila Svyatoslavovich Moscow, RU 2 4
Rogachkov, Sergey Viktorovich Moscow, RU 2 1
Zhodzishsky, Mark Isaakovich Moscow, RU 13 79

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