PROBE PINS WITH ETCHED TIPS FOR ELECTRICAL DIE TEST
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United States of America Patent
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N/A
Issued Date -
Jul 2, 2020
app pub date -
Mar 12, 2020
filing date -
Mar 28, 2016
priority date (Note) -
Published
status (Latency Note)
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Abstract
A prober head to interface an E-testing apparatus to a device under test, which may be an unpackaged die, for example. In some embodiments, the prober head includes an array of conductive pins, each of the pins extending outwardly from a first pin end anchored to a substrate. At least a partial length of each of the pins is coated with a hydrophobic monolayer. The conductive pins may be composite metal wires including a core metal encased by one or more peripheral metal. At a tip of the pins, opposite the first pin end anchored to the substrate, the peripheral metals are recessed from the core metal. In further embodiments, the hydrophobic monolayer is disposed on an outer surface of the peripheral metals, but is substantially absent from a surface of the core metal exposed at the tip.
First Claim
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Family
| Country | kind | publication No. | Filing Date |
|---|---|---|---|
| US | B2 | US10598696 | Mar 28, 2016 |
| WO | A2 | WO2017172115 | Feb 21, 2017 |
International Classification(s)
- 2020 Application Filing Year
- G01R Class
- 5074 Applications Filed
- 3834 Patents Issued To-Date
- 75.57 % Issued To-Date
Cited Art Landscape
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- G01R Class
- 0 % this patent is cited more than
- 5 Age