INTERFACE ELEMENT FOR A TESTING APPARATUS OF ELECTRONIC DEVICES AND CORRESPONDING MANUFACTURING METHOD
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United States of America Patent
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Issued Date -
Jun 25, 2020
app pub date -
Mar 3, 2020
filing date -
Sep 7, 2017
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Abstract
An interface element (20) for a testing apparatus of electronic devices comprises at least one support (21) provided with a plurality of through-openings (22) that house respective interconnections elements (23), which extend between a first end (23a) and a second end (23b). Suitably, the interconnections elements (23) are made of a conductive elastomer that fills the openings (22) of the support (21), each of the interconnection elements (23) forming a conductive channel between different and opposing faces (Fa, Fb) of the support (21).
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