PHOTOMASK AND METHOD FOR FORMING THE SAME

Number of patents in Portfolio can not be more than 2000

United States of America

APP PUB NO 20200089098A1
SERIAL NO

16134339

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Abstract

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A method for forming a photomask includes receiving a mask substrate including a protecting layer and a shielding layer formed thereon, removing portions of the shielding layer to form a patterned shielding layer, and providing a BSE detector to monitor the removing of the portions of the shielding layer. When a difference in BSE intensities obtained from the BSE detector is greater than approximately 30%, the removing of the portions of the shielding layer is stopped. The BSE intensity in following etching loops becomes stable.

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Patent Owner(s)

Patent OwnerAddress
TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY LTDNO 8 LI-HSIN RD VI HSINCHU SCIENCE PARK HSINCHU 300

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
CHANG, HAO-MING PINGTUNG CITY, TW 59 184
WANG, HSUAN-WEN KAOHSIUNG CITY, TW 10 105

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