TEMPERATURE MEASURING DEVICE AND METHOD FOR MEASURING TEMPERATURE

Number of patents in Portfolio can not be more than 2000

United States of America

APP PUB NO 20200064206A1
SERIAL NO

16674928

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Abstract

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A temperature measuring device includes first and second semiconductor elements each of which has a p-n junction, a transistor group including a plurality of transistors of which respective sources are connected to a power source and of which respective gates are connected to each other, the plurality of transistors constituting a current source, the transistor group being configured to output a first current and a second current having a different magnitude from the first current to the first and second semiconductor elements, respectively, and a selector configured to select at least one first transistor and a plurality of second transistors different from the first transistor, from among the plurality of transistors.

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Patent Owner(s)

Patent OwnerAddress
SOCIONEXT INCKOHOKU-KU YOKOHAMA-SHI KANAGAWA 222-0033

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
HAMANO, Hiroyuki Kanagawa, JP 67 1458
MIYAZAKI, Takashi Kanagawa, JP 144 1645

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