PROBE STRUCTURE AND METHOD FOR PRODUCING PROBE STRUCTURE

Number of patents in Portfolio can not be more than 2000

United States of America

APP PUB NO 20200041543A1
SERIAL NO

16495842

Stats

ATTORNEY / AGENT: (SPONSORED)

Importance

Loading Importance Indicators... loading....

Abstract

See full text

A probe structure is provided with: a holding plate which has a first surface and a second surface in which at least the first surface is insulated; a plurality of electrodes which are formed on the first surface of the holding plate in such a state that the plurality of electrodes is separated from each other; and carbon nanotube structures which are erected on the electrodes 3. The holding plate is provided with through holes which correspond to the electrodes, respectively.

Loading the Abstract Image... loading....

First Claim

See full text

Family

Loading Family data... loading....

Patent Owner(s)

Patent OwnerAddress
NIDEC-READ CORPORATION10 TSUTSUMISOTO-CHO NISHIKYOGOKU UKYO-KU KYOTO 615-0854

International Classification(s)

Inventor(s)

Inventor Name Address # of filed Patents Total Citations
FUJINO, Makoto Kyoto, JP 75 796
MAEDA, Michihisa Kyoto, JP 5 48
NUMATA, Kiyoshi Kyoto, JP 8 44
YAMAZAKI, Hidekazu Kyoto, JP 74 406

Cited Art Landscape

Load Citation

Patent Citation Ranking

Forward Cite Landscape

Load Citation