MEASUREMENT APPARATUS AND MEASUREMENT METHOD

Number of patents in Portfolio can not be more than 2000

United States of America

APP PUB NO 20200041251A1
SERIAL NO

16528509

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ATTORNEY / AGENT: (SPONSORED)

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Abstract

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A measurement apparatus and a measurement method capable of speedily and accurately measuring an edge shape are provided. A measurement apparatus according to an aspect of the present disclosure includes an objective lens positioned so that its focal plane cuts across an edge part of a substrate, a detector including a plurality of pixels and configured to detect a reflected light from the edge part of the substrate through a confocal optical system, an optical head in which the objective lens and the detector are disposed, a moving mechanism configured to change a relative position of the optical head with respect to the substrate so that an inclination of the focal plane with respect to the substrate is changed, and a processing unit configured to measure a shape of the edge part.

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Patent Owner(s)

Patent OwnerAddress
LASERTEC CORPORATIONYOKOHAMA

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Inventor(s)

Inventor Name Address # of filed Patents Total Citations
GONDAIRA, Ko Yokohama-shi, JP 5 1
TAKIZAWA, Hideo Yokohama-shi, JP 14 82
YAMAZAKI, Teruaki Yokohama-shi, JP 3 34

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